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Yelo releases details of new products at ECOC 2015
Yelo, a world leader in laser diode and photodiode characterisation, burn-in and life-test systems is exhibiting at booth 414.
Y1000L – COC
Yelo have upgraded its’ Y1000L-COC system to burn-in 100G chip on carrier and photonic integrated circuits.
Y256 LDD
Yelo launched its new 256 channel Laser diode driver system incorporating controlling software (Yelo’s comprehensive burn-in software is available if required). This laser diode driver system can be rack mounted or used as a bench test system to create your own life-test or burn-in system.
Y32 LIV
Reduce handling damage and increase device yield using Yelo’s industry standard burn-in/life-test modules. Yelo has developed the Y32LIV, a Pre and Post Burn-in test suite, which allows the customer to load devices once into the module for the test/burn-in/test processing for high volume COC and PIC devices.
If you would like any more information on Yelo exhibiting at ECOC or the products and services we offer, follow us on Twitter @Yelotestsystems, connect with us on LinkedIn ‘Yelo Test Systems Ltd’ or visit our website for more information:
